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Journal Articles

Enhanced charge collection by single ion strike in AlGaN/GaN HEMTs

Onoda, Shinobu; Hasuike, Atsushi*; Nabeshima, Yoshiaki*; Sasaki, Hajime*; Yajima, Kotaro*; Sato, Shinichiro; Oshima, Takeshi

IEEE Transactions on Nuclear Science, 60(6), p.4446 - 4450, 2013/12

https://doi.org/10.1109/TNS.2013.2289373

Times Cited Count：43 Percentile：94.67(Engineering, Electrical & Electronic)

no abstracts in English